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EssentOptics shows its PHOTON RT at coming PhotonicsWest 2017
Transmittance measurement of short-throw mini objectives with LINZA 150 spectrophotometer
EssentOptics introduce the state-of-art LINZA 150 lens testing spectrophotometer at Optatec 2016
EssentOptics will show its PHOTON RT spectrophotometer at SPIE Photonics Europe 2016 Exhibition in Brussels
EssentOptics is proud to announce successful commissioning of PHOTON RT spectrophotometer at TOPTEC.
EssentOptics Ltd. will present its most advanced PHOTON RT spectrophotometer at coming PhotonicsWest 2016 (Booth #732, 16-18 February 2016, Moscone Center, San Francisco, CA, USA).
EssentOptics Ltd., a leading producer of UV-VIS-MWIR spectrophotometers for optical coaters, sets a new benchmark for the effective wavelength range of this type of spectrophotometer instrument and announces the expanded Mid Wave IR (MWIR) range configurations for its Photon RT spectrophotometers.
EssentOptics will take part in coming Photonex 2015 and exhibit its PHOTON RT scanning spectrophotometer.
EssentOptics add new features and improved capabilities to its trend-setting PHOTON RT spectrophotometer. The upgraded unit will be showcased at coming Laser World of Photonics 2015 exhibition in Munich, Germany (June 22-25, 2015)
PHOTON RT Spectrophotometers
World's first UV-VIS-MWIR spectrophotometer designed for optical coaters
PHOTON RT 7512 Spectrophotometers
The instrument allows measuring the transmission and reflection of coatings designed for LWIR
Linza 150 Spectrophotometers
The world's only spectrophotometer developed to test lenses and lens assemblies
Linza 2752 Spectrophotometers
The unique instrument specially designed to MWIR On-axis transmission measurement of lenses and lens assemblies
AKRA Monochromatic Optical Monitoring System
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process.
IRIS Broadband Optical Monitoring Systems
IRIS systems are designed to control the transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coating. Designed for integration virtually into any vacuum chamber