EssentOptics will show its PHOTON RT spectrophotometer at SPIE Photonics Europe 2016 Exhibition in Brussels
EssentOptics is proud to announce successful commissioning of PHOTON RT spectrophotometer at TOPTEC.
EssentOptics Ltd. will present its most advanced PHOTON RT spectrophotometer at coming PhotonicsWest 2016 (Booth #732, 16-18 February 2016, Moscone Center, San Francisco, CA, USA).
EssentOptics Ltd., a leading producer of UV-VIS-MWIR spectrophotometers for optical coaters, sets a new benchmark for the effective wavelength range of this type of spectrophotometer instrument and announces the expanded Mid Wave IR (MWIR) range configurations for its Photon RT spectrophotometers.
EssentOptics will take part in coming Photonex 2015 and exhibit its PHOTON RT scanning spectrophotometer.
EssentOptics add new features and improved capabilities to its trend-setting PHOTON RT spectrophotometer. The upgraded unit will be showcased at coming Laser World of Photonics 2015 exhibition in Munich, Germany (June 22-25, 2015)
EssentOptics successfully completes its first projects in USA and Israel serving advanced technology companies.
EssentOptics present Photon RT spectrophotometer with new measurement features at Photonica-2015. The new version of PhotonSoft program features advanced capability to conduct group measurements of single and multiple substrates.
PHOTON RT spectrophotometer will be shown at PHOTONICS WEST 2015 exhibition in the US.
For the first time in its history EssentOptics will take part in the largest and most respected US exhibition on optics and photonics technologies (February 10-12, 2015. San Francisco, CA).
EssentOptics highlight latest features of PHOTON RT spectrophotometer at IR Fair 2014 (Tokyo, Japan)
PHOTON RT Spectrophotometers
World's first UV-VIS-MWIR spectrophotometer designed for optical coaters
Linza 150 Spectrophotometers
The world's only spectrophotometer developed to test lenses and lens assemblies
AKRA Monochromatic Optical Monitoring System
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process.
IRIS Broadband Optical Monitoring Systems
IRIS systems are designed to control the transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coating. Designed for integration virtually into any vacuum chamber