Join us at the 18th International Conference on Laser Optics (ICLO 2018)
The company EssentOptics will take part in the 18th International Conference on Laser Optics (ICLO 2018). The exhibition will be held from 05 to 07 June 2018 in the MOSKOVSKY CONGRESS HALL (Hotel Holiday Inn St. Petersburg Moscow Gate, Moscow Avenue 97A ). Booth #11.
Photon RT, the only spectrophotometer designed for coaters, will be demonstrated at the exhibition.
- Unattended 0 – 75 deg AOI and S/P polarization measurements, no attachments required
- Measure optics in minutes, not hours or days
- No baseline recalibration with the change of angle of incidence or transmittance / absolute reflectance
- Unique broadband configuration 185 – 5200 nm
You cannot produce any better than you measure!
Meet us at booth #11.
Conference and Exhibition Website: ICLO 2018
Products essentoptics
Measurement of transmittance and reflectance of flat optics at variable angles and polarization
PHOTON RT Spectrophotometers
World's first UV-VIS-MWIR spectrophotometer designed for optical coaters
LWIR spectral measurement of plano optics and prisms
PHOTON RT 7512 Spectrophotometers
The instrument allows measuring the transmission and reflection of coatings designed for LWIR
Measurement of transmittance and reflectance of lenses and lens assemblies
Linza 150 Spectrophotometers
The world's only spectrophotometer developed to test lenses and lens assemblies
MWIR spectral measurements of lens and lens assemblies
Linza 2752 Spectrophotometers
The unique instrument specially designed to MWIR On-axis transmission measurement of lenses and lens assemblies
Monochromatic process control of the deposition of optical coatings in real time
AKRA Monochromatic Optical Monitoring System
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process.
Real-time deposition process monitoring of optical coatings
IRIS Broadband Optical Monitoring Systems
IRIS systems are designed to control the transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coating. Designed for integration virtually into any vacuum chamber