Outstanding spectral measurements of optical coatings
We develop high-precision optical instruments to measure transmittance and reflectance on virtually any type of optical sample you can imagine
Measurement of transmittance and reflectance of flat optics at variable angles and polarization
PHOTON RT Spectrophotometers
World's first UV-VIS-MWIR spectrophotometer designed for optical coaters
LWIR spectral measurement of plano optics and prisms
PHOTON RT 7512 Spectrophotometers
The instrument allows measuring the transmission and reflection of coatings designed for LWIR
Measurement of transmittance and reflectance of lenses and lens assemblies
Linza 150 Spectrophotometers
The world's only spectrophotometer developed to test lenses and lens assemblies
MWIR spectral measurements of lens and lens assemblies
Linza 2752 Spectrophotometers
The unique instrument specially designed to MWIR On-axis transmission measurement of lenses and lens assemblies
Monochromatic process control of the deposition of optical coatings in real time
AKRA Monochromatic Optical Monitoring System
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process.
Real-time deposition process monitoring of optical coatings
IRIS Broadband Optical Monitoring Systems
IRIS systems are designed to control the transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coating. Designed for integration virtually into any vacuum chamber
News
All news
06.06.2023
EssentOptics demonstrates the two latest metrology systems designed for MWIR and LWIR spectral measurements of optical thin films.
12.07.2022
EssentOptics has developed the XY-MZF motorized stage, focusing specifically on fast, unattended, and high-quality spectral measurements of multi-zone filters, as well as linear variable filters.
12.02.2021
EssentOptics will participate in EPIC Photonics+, on February 17-18, 2021. Visit our virtual booth!
13.01.2020
EssentOptics will participate in the Photonics West 2020 exhibition
San Francisco, CA, USA
February 4-6, 2020
06.10.2019
October is hot for premier photonics events and EssentOptics is ready to meet you! Whether you see us at Photonex 2019 (Coventry, UK) or join us at Optifab 2019 (Rochester, NY), we are happy to provide answers to most of the questions on thin film optical metrology.
What makes us different
We have our own production technology well down to the key components - spectrometers and monochromators. As a result, we can easily adapt our solutions to the individual requirements of our customers allowing us to be more flexible in implementing responsible projects.
Our instruments combine original technical and optical solutions, high meassurement accuracy and long-term reliable operation, providing our customers with a real competitive advantage.
Who We Are
EssentOptics develops and manufactures optical instruments based on originally designed spectrometers and monochromators. All our products are specifically designed to meet the needs of optical coating experts.
Process Control
IRIS and AKRA optical monitoring systems offer reliable process control ensuring deposition of optical coatings in the UV, VIS and IR ranges. The AKRA systems cover the widest spectrum range available now on the market. The IRIS broadband systems support our customers for trustful and high process yeild deposition even for high-spec coatings Read more
Measurement of plano optics
PHOTON RT UV-VIS-MWIR Universal Spectrophotometer is the only instrument on the market designed for unattended measurement of optical samples with coatings from 185 nm up to 5200 nm. Unique set of capabilities like absolute specular reflectance, transmittance and polarization-dependent measurements are provided as standard Read more
Testing of lenses
LINZA 150 spectrophotometer offers unique opportunity for unattended measurement of transmittance and reflectance on lenses and lens assemblies Read more
Thin Film Calculation
MultiSpectrum thin film software is designed for calculation of the intermediate target layers and supports our optical monitoring systems for reliable control of the vacuum deposition process Read more