The LINZA 150 spectrophotometer is designed for broadband transmittance and reflectance measurement of lenses and lens assemblies (objectives), adding a whole new dimension to your optical metrology capabilities.
Indeed, lenses come in vast variety of sizes and shapes which makes them extremely difficult to measure. Given the inherent challenges in measuring transmittance or reflectance on lenses, optical engineers often need to combine data from a several witness samples in order to tease out basic details about optical performance of a lens. However, due to the nature of any deposition technology, the coating on lenses differs from that on the witness sample. Even more insurmountable barrier is the need to measure the off-axis performance of the optical lens .
With LINZA 150, you get transmission data on axis and reflection data at any point of the lens surface, fully unattended. This ensures that only perfect lenses with perfect coatings are delivered to customers and approved for lens assemblies. This valuable data also helps our customers to backward analyze and improve their deposition technology.
LINZA 150 Spectrophotometer is also a great instrument for your QA/QC lab ensuring that lenses from your supplier do meet your specs. The instrument is perfectly suited for both routine lens measurements and sophisticated improvement of lens coating technology.
The following product features are found only in LINZA 150 Spectrophotometers and help our customers measure the coatings on lenses and lens assemblies successfully:
Main product specifications:
LINZA Spectrophotometer. Product Configuration | ||
---|---|---|
MODEL | 0217 | 0417 |
PARAMETER |
DESCRIPTION |
|
OPTICAL CONFIGURATION | ||
Photometric functions | %T, %R | |
Effective wavelength range, nm | 185 - 1700 | 380 - 1700 |
Optical scheme of monochromator | Czerny-Turner | |
Optics | Mirror, Al + SiO2, Al + MgF2 | |
Reference channel | Yes | |
Wavelength scanning speed, nm / min | 3000 (at 5 wavelength sampling pitch) | |
Spot size on measured sample, mm |
Transmittance: 6,0 x 5,5 Reflectance: 1,0 x 1,0 |
|
Wavelength sampling pitch, nm | 0,5 - 100 | |
Ultimate spectral resolution, nm 185 (380) - 990 nm 990 - 1700 nm |
2,00 4,00 |
2,00 4,00 |
Wavelength accuracy, nm | 0,5 | |
Wavelength repeat accuracy, nm | + / - 0,25 | |
Scattered light level, % max (@ 532 nm) | < 0,1 | |
Photometric accuracy |
NIST SRM 930: +/- 0,003 Abs (1Abs) NIST SRM 1930: +/- 0,003 Abs (0,33 Abs); +/- 0,006 Abs (2 Abs) |
|
Photometric repeat accuracy |
NIST SRM 930: +/- 0,0006 Abs (1Abs) NIST SRM 1930: +/- 0,0002 Abs (0,33 Abs); +/- 0,005 Abs (2 Abs) Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements |
|
Stability of baseline (UV-VIS), % / hour | < 0,1 | |
Light sources | Deuterium lamp, Halogen lamp, HgAr wavelength calibration verification lamp | Halogen lamp, HgAr wavelength calibration verification lamp |
SAMPLE COMPARTMENT |
||
Lens diameter, mm |
Trasmittance: 10 - 150 Reflectance: 10 - 90 (self-centering lens mount) 10 - 115 (customized lens holder) |
|
Reflectance measurement, mm |
Lens radius: - ∞ ... - 15 ... / + 15 ... + ∞ |
|
Transmittance measurement, mm |
Focal length of the measured sample: - ∞ ... - 20 / + 20 ... + ∞ |
|
End to end maximum length of the lens assembly, mm | 240 | |
Sampling pitch for determination of measurement point on lens surface (off-axis reflectance measurement), mm | 0,01 | |
Angle of incidence (on-axis / off-axis reflectance measurement), deg | 12 | |
INTERFACE, DIMENSIONS AND WEIGHT |
||
Interface |
USB 2.0 |
|
Power consumption, Watt |
110 |
|
Power input |
110-220 VAC, 50-60 Hz |
|
Width x Depth x Height, mm |
680 x 440 x 360 (26 3/4" x 17 1/3" x 14 1/5") |
|
Net weight, kg (lbs) |
50 (110) |
The LINZA 150 spectrophotometers are designed to measure coatings on lenses.
This is one of the most challanging tesing procedures due to vast variety of lenses used today. As a result, optical experts traditionally evaluate the performance of coatings using witness samples from the each coating batch. The imperfection of this method lies in the difference in the optical characteristics of the witness sample and the lens. In addition, such verification method cannot be used at all to quantify the coating uniformity on the lens' surface.
The LINZA 150 spectrophotometer successfully addresses both issues and offers a solution for direct UV-VIS-NIR measurement of convex, concave and cylindrical lenses both on-axis and off-axis. Just look at the examples below and learn more about the LINZA 150 unmatched capabilities to measure transmittance and reflectance on spherical surfaces.
PHOTON RT UV-VIS-MWIR Spectrophotometer
The PHOTON RT UV-VIS-MWIR scanning spectrophotometer is a versatile instrument designed for unattended measurements of planar optical parts with coatings in the 185-5200 nm wavelength range. It measures absolute reflectance and transmittance at angles of incidence from 0 to 75 degrees and with variable polarization, all without needing any additional attachments
PHOTON RT 7512 LWIR Spectrophotometer
The PHOTON RT 7512 spectrophotometer is a distinctive dispersive-type instrument designed for LWIR transmission and reflection measurements of optical coatings (7 500 nm - 14 000 nm). It operates at both normal and variable angles of incidence and supports S-pol/P-pol polarization
PHOTON RT 0420 Ultra Spectrophotometer
High-performance spectrophotometer for VIS-SWIR transmission measurement of ultra-narrow bandpass filters, edge filters with extremely steep slopes, notch filters, and coatings with high optical density
LINZA 2752 MWIR Spectrophotometer
LINZA 2752 spectrophotometer is the most advanced soution for MWIR on-axis transmission measurement of lenses and fully assembled lens objectives.