About EssentOptics
We at EssentOptics solve problems that no one has ever approched before.
EssentOptics manufacture state-of-the-art spectral measurement instruments for inspection of thin films on flats and lenses. Our metrology-grade spectrophotometers are tailored for UV-VIS-MWIR-LWIR transmittance and reflectance measurement at variable angles and polarizations.
Our technologies empower customers around the world and motivate them to design and manufacture better optical coatings with cutting-edge performance, enabling them to conduct research in space exploration, lasers, biology, night vision, augmented and virtual reality, and wherever optical coatings play a vital role.
Currently, we are regarded as one the most competent provider of thin film spectral measurement solutions on the market.
Products essentoptics
Measurement of transmittance and reflectance of flat optics at variable angles and polarization
PHOTON RT Spectrophotometers
World's first UV-VIS-MWIR spectrophotometer designed for optical coaters
LWIR spectral measurement of plano optics and prisms
PHOTON RT 7512 Spectrophotometers
The instrument allows measuring the transmission and reflection of coatings designed for LWIR
Measurement of transmittance and reflectance of lenses and lens assemblies
Linza 150 Spectrophotometers
The world's only spectrophotometer developed to test lenses and lens assemblies
MWIR spectral measurements of lens and lens assemblies
Linza 2752 Spectrophotometers
The unique instrument specially designed to MWIR On-axis transmission measurement of lenses and lens assemblies
Monochromatic process control of the deposition of optical coatings in real time
AKRA Monochromatic Optical Monitoring System
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process.
Real-time deposition process monitoring of optical coatings
IRIS Broadband Optical Monitoring Systems
IRIS systems are designed to control the transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coating. Designed for integration virtually into any vacuum chamber