EssentOptics demonstrates the two latest metrology systems designed for MWIR and LWIR spectral measurements of optical thin films.
EssentOptics has developed the XY-MZF motorized stage, focusing specifically on fast, unattended, and high-quality spectral measurements of multi-zone filters, as well as linear variable filters.
EssentOptics will participate in EPIC Photonics+, on February 17-18, 2021. Visit our virtual booth!
EssentOptics will participate in the Photonics West 2020 exhibition
San Francisco, CA, USA
February 4-6, 2020
October is hot for premier photonics events and EssentOptics is ready to meet you! Whether you see us at Photonex 2019 (Coventry, UK) or join us at Optifab 2019 (Rochester, NY), we are happy to provide answers to most of the questions on thin film optical metrology.
EssentOptics shows its latest thin film metrology solutions in Munich
EssentOptics announces new benchmark performance record with its heavily upgraded PHOTON RT spectrophotometer
EssentOptics will take part in the 18th International Conference on Laser Optics (ICLO 2018), June 05 - 07, 2018 St. Petersburg, Russia.
EssentOptics takes part in Optatec 2018, the international trade fair for optical technologies, components and systems
EssentOptics Ltd, a leading developer of innovative test and measurement instruments for optical coating industry, has received CE mark for the PHOTON RT spectrophotometers, a unique metrology tool designed for coating experts.
PHOTON RT Spectrophotometers
World's first UV-VIS-MWIR spectrophotometer designed for optical coaters
PHOTON RT 7512 Spectrophotometers
The instrument allows measuring the transmission and reflection of coatings designed for LWIR
Linza 150 Spectrophotometers
The world's only spectrophotometer developed to test lenses and lens assemblies
Linza 2752 Spectrophotometers
The unique instrument specially designed to MWIR On-axis transmission measurement of lenses and lens assemblies
AKRA Monochromatic Optical Monitoring System
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process.
IRIS Broadband Optical Monitoring Systems
IRIS systems are designed to control the transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coating. Designed for integration virtually into any vacuum chamber