EssentOptics is expanding its international presence through a new distribution agreements with Indeco, Inc (Japan), and VM-TIM (Germany)
Photon RT spectrophotometer from EssentOptics wins Laser Association 2012 Award
Photon RT spectrophotometer from EssentOptics is awarded "The Best Innovative Product" medal.
EssentOptics will take part in the 7th International Forum on Optical Devices and Technologies "OPTICS-EXPO 2011" to be held during October 25-28 in All Russia Exhibition Center in Moscow.
EssentOptics has received three orders for its latest PHOTON RT research-grade spectrophotometer from customers in Russia and Belarus
New May 2011 Application Note presents customer results of deposition of IR interference filters using IRIS 1017 spectral optical monitoring system.
Optical companies in St. Petersburg and Stavropol choose AKRA IR optical monitoring systems and ECLAT fast spectrophotometers for processs control.
EssentOptics announces new installations of its advanced AKRA IR Optical Monitoring Systems to control the deposition of multilayer optical coatings. A new AKRA 1550 system was commissioned recently at "Sapphire" (Moscow, Russia).
EssentOptics commissioned new AKRA 0450 single wavelength optical monitoring system in Smolensk, Russia
EssentOptiсs announces addition of new instrumentation to the list of its optical products. On the basis of recently completed studies a new instruments, ECLAT 0417 and IRIS 0417 with an extended spectral range 380-1700 nm, are offered starting January 2011.
PHOTON RT Spectrophotometers
World's first UV-VIS-MWIR spectrophotometer designed for optical coaters
Linza 150 Spectrophotometers
The world's only spectrophotometer developed to test lenses and lens assemblies
AKRA Monochromatic Optical Monitoring System
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process.
IRIS Broadband Optical Monitoring Systems
IRIS systems are designed to control the transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coating. Designed for integration virtually into any vacuum chamber