PHOTON RT UV-VIS-MWIR Spectrophotometers for Coaters

PHOTON RT UV-VIS-MWIR SPECTROPHOTOMETER

  • World's first spectrophotometer designed for optical coaters
  • World's only instrument to feature UV-MWIR (220-5200 nm) polarization measurement capability, a unique opportunity offering deeper insight into real performance of optical coatings

The PHOTON RT UV-VIS-MWIR scanning spectrophotometer is designed specifically for unattended measurement of optical samples with coatings. The instrument is produced in six configurations relative to the effective wavelength range - from 185 nm up to 5200 nm.

KEY ADVANTAGES:

  • Record-wide wavelength range configuration in a single instrument: 185-5200 nm
  • More than 10 times faster measurement compared to other tools on the market
  • No need to re-calibrate the baseline after change of angle of incidence
  • Measurement of transmittance and absolute specular reflectance from the same area on the substrate – perfect for backward analyses of thin film design
  • Measurement of complex cemented prisms with arbitrary direction of outgoing beams
  • Measurement of beamsplitters with variable AOI's and beam off-set up to +/- 60 mm
  • Radically minimized human errors in the measurement process due to fully automated procedures

 

Auto-detect motorized stages

Z STAGE
Offers baseline calibration and subsequent test without user intervention
XY STAGE
Designed for testing a sample at multiple surface points
MULTIPLE SAMPLE STAGE
Designed for fully automatic testing of 7 samples (1" or 30 mm OD size) including baseline calibration

PHOTON RT Multifunctional Spectrophotometer. Technical Specifications

  PHOTON RT Spectrophotometer. Product Configuration
  185 - 1700 185 - 3500 185 - 5200 380 - 1700 380 - 3500 380 - 5200
PRODUCT SPECIFICATIONS
Optical scheme of monochromator Czerny-Turner
Optics Mirror, MgF2
Reference channel Yes
Wavelength sampling pitch, nm  0,1 - 100
Wavelength scanning speed, nm/min 3 000 (at 5 nm wavelength sampling pitch)
Spot size on the measured sample, nm 6 х 2 
Turning pitch angle of sample stage 0,01 deg
Turning pitch angle of photodetectors 0,01 deg
Beam displacement compensation -60 mm ... 0 ... +60 mm (actual value depends on detector position)
Variable angle measurements

1. 0 - 75 deg for transmittance (up to 85 deg with 70 - 85 sample stage)

2. 8 - 75 deg for absolute reflectance (up to 85 deg with 70 - 85 sample stage)

3. Detector rotation range: 300 deg ... 180 deg ... 16 deg

4. Sample stage rotation range: -85 deg ... 0 deg ... +85 deg

Wavelength subranges, nm Ultimate spectral resolution, nm (non-polarized light) Wavelength accuracy, nm Wavelength repeat accuracy, nm
185 - 350 nm 0,3 +/-0,12 +/-0,06
350 (380) - 990 nm 0,6 +/-0,24 +/-0,12
990 - 1650 nm 1,2 +/-0,48 +/-0,24
1650 - 2450 nm 1,2 +/-0,48 +/-0,24
2450 - 5200 nm 2,4 +/-0,96 +/-0,48
Stray light level, % at 532 nm ˂0,1
Angle of beam divergence +/-1 deg
Photometric accuracy

(VIS)

NIST SRM 930e: +/-0,003 Abs (1Abs)

NIST SRM 1930: +/-0,003 Abs (0.33Abs); +/-0,006 Abs (2Abs)

(MWIR)

NRC NG11 SRM: +/-0,0013 Abs (0,13 Abs); +/-0,0053 Abs (0,49 Abs); +/-0,0011 Abs (0,82 Abs); +/-0,005 Abs (1,0 Abs)

Photometric repeat accuracy (VIS range)

(VIS)

NIST SRM 930e: 0,0004 Abs (1 Abs)

NIST SRM 1930: 0,0001 Abs (0,33 Abs); 0,005 Abs (2 Abs)

(MWIR)

NRC NG11 SRM: +/-0,0003 Abs (0,13 Abs); +/-0,0008 Abs (0,49 Abs); +/-0,0022 Abs (0,82 Abs); +/-0,0034 Abs (1,0 Abs)

Determined using 0,1 second accumulation, maximum deviation for 10 subsequent measurements

Stability of baseline, %/hour (VIS range) ˂0,1 (one hour warm-up time)
Unattended polarization measurements with built-in polarizers

a. S, P, (S + P)/2, Random

b. User defined S:P ratio for incident beam (20/80, 30/70 etc)

Built-in polarizers, nm 220 - 1700 220 - 3500 220 - 5200 380 - 1700 380 - 3500 380 - 5200
Zero order / Green beam Built-in, automatic
Light sources, preinstalled

1. Halogen lamp: 1 ea

2. HgAr wavelength calibration verification lamp: 1 ea

  Deuterium lamp: 1 ea Deuterium lamp: 1 ea Deuterium lamp: 1 ea      
      IR source: 1 ea     IR source: 1 ea
Light sources, spare Halogen lamp: 2 ea (included with shipment). Other spare light sources can be ordered
SAMPLE COMPARTMENT
Dovetail baseplate for sample stages Designed for mounting of motorized and non-motorized sample stages. Integrated controller ensures instant detection of the motorized stage
Planar sample stage

For measurement of transmission and reflection of planar samples with size bigger than 12x10 mm

Independent positioning

Independent computer controlled positioning of sample stage and photodetectors unit

Synchronized positioning Synchronized computer controlled positioning of sample stage and photodetectors unit dependingon the selected photometric function 
Size of samples

Min. 12x10 mm - for measurement at 0 - 10 deg incidence angles

Min. 12x25 mm - for measurement at 10 - 75 deg incidence angles

Max. sample size:

  • up to 152,4 mm (6") with closed lid for standard sample stage
  • up to 140,0 mm (5 1/2") with closed lid for Z sample stage
Sample stage for PBS cubes 50x50x50 mm sample stage with two additional cube holders 1"x1"x1" and 1/2"x1/2"x1/2"
Optional motorized and non-motorized sample stage

1. Multiposition Stage base, motorized, auto-detect

1.1 1" / 8 position disk for multiposition stage base

1.2 30 mm / 8 position disk for multiposition stage base

2. XY Stage. +/-12,5 mm travel. Sample size 40x44 mm

3. Z Stage

4. 70 - 85 deg AOI Sample Stage, not motorized (Photon Rt 1)

5. 70 - 85 deg AOI Sample Stage, not motorized (Photon Rt 2)

USER INTERFACE, DIMENSIONS AND WEIGHT
Interface USB 2.0, Windows-based, English
File saving formats res (txt), xls, pdf, csv
Power consumption, Watt 110
Power input 110 - 220 V (+/-10%), 50 - 60 Hz
Purging Sample compartment, light sources, monochromator
Width х Depth х Height, mm (inches) 425 х 625 х 285 (16 3/4" х 24 2/3" х10 1/5")
Net weight, kg (lbs) 50 (110)