Meet EssentOptics at EPIC Photonics+
Dear Partner,
We really miss meeting people live!
But we are also thrilled at all the opportunities that modern technology offers us nowadays - virtual meetings and exhibitions are connecting partners all around the globe.
And this time it is happening at PHOTONICS+ Virtual Exhibition and Conference on February 17-18, 2021. In less than 10 days the whole industry will meet on your computer screen!
Join us to:
- discuss the challenges your business is facing in thin film optical metrology,
- see what solutions EssentOptics can offer you,
- get to know the latest development and features in our products,
- watch the live presentation by our CEO Taras Lisouski on February 17 at 16:50 CET,
- visit our virtual booth!
We will be happy to provide you with the free access code - please let us know if you want one!
Products essentoptics
Measurement of transmittance and reflectance of flat optics at variable angles and polarization
PHOTON RT Spectrophotometers
World's first UV-VIS-MWIR spectrophotometer designed for optical coaters
LWIR spectral measurement of plano optics and prisms
PHOTON RT 7512 Spectrophotometers
The instrument allows measuring the transmission and reflection of coatings designed for LWIR
Measurement of transmittance and reflectance of lenses and lens assemblies
Linza 150 Spectrophotometers
The world's only spectrophotometer developed to test lenses and lens assemblies
MWIR spectral measurements of lens and lens assemblies
Linza 2752 Spectrophotometers
The unique instrument specially designed to MWIR On-axis transmission measurement of lenses and lens assemblies
Monochromatic process control of the deposition of optical coatings in real time
AKRA Monochromatic Optical Monitoring System
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process.
Real-time deposition process monitoring of optical coatings
IRIS Broadband Optical Monitoring Systems
IRIS systems are designed to control the transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coating. Designed for integration virtually into any vacuum chamber