EssentOptics shows its latest thin film metrology solutions in Munich during the Laser World of Photonics 2019 - the biggest International Trade Fair for the Photonics Industry.
Our highlights for the coming show:
This time our trend-setting instrument features 185-5200 nm wavelength range and has a totally new capability - unattended transmittance measurement of complex cemented prisms with arbitrary direction of outgoing beams. The new feature helps performing quality checks for ready-to-use components and simulates field performance of the product.
From now, the reflectance measurement capability at different areas on lens surface is possible even for aspheric lenses. The lens diameter can vary from 10 mm to 115 mm, the data can be taken seamlessly from the lens axis ot the lens edge to verify uniformity of the coating along the lens surface.
Please visit our booth B1 - 427 to discover our latest technologies and or make an appointment to discuss your applications.
PHOTON RT Spectrophotometers
World's first UV-VIS-MWIR spectrophotometer designed for optical coaters
Linza 150 Spectrophotometers
The world's only spectrophotometer developed to test lenses and lens assemblies
AKRA Monochromatic Optical Monitoring System
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process.
IRIS Broadband Optical Monitoring Systems
IRIS systems are designed to control the transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coating. Designed for integration virtually into any vacuum chamber