EssentOptics shows its latest thin film metrology solutions in Munich

EssentOptics shows its latest thin film metrology solutions in Munich during the Laser World of Photonics 2019 - the biggest International Trade Fair for the Photonics Industry.

Our highlights for the coming show:

PHOTON RT Spectrophotometer

This time our trend-setting instrument features 185-5200 nm wavelength range and has a totally new capability - unattended transmittance measurement of complex cemented prisms with arbitrary direction of outgoing beams. The new feature helps performing quality checks for ready-to-use components and simulates field performance of the product.

LINZA 150 Spectrophotometer

From now, the reflectance measurement capability at different areas on lens surface is possible even for aspheric lenses.  The lens diameter can vary from 10 mm to 115 mm, the data can be taken seamlessly from the lens axis ot the lens edge to verify uniformity of the coating along the lens surface.

Please visit our booth B1 - 427 to discover our latest technologies and or make an appointment to discuss your applications.