Application of the spectral optical monitoring systems for deposition ofIR interference filters

A demand for the technology ensuring reliable depsition of interference filters for laser technology, spectroscopy, optical analytical instruments etc. is very high today. This constantly increasing need for high quality optical coatings automatically raises needs and requirements for thin film deposition control technologies. Modern optical monitoring methods can significantly improve the accuracy of the resulting spectral characteristics of sophisticated optical coatings, as well as the reproducibility of these characteristics from batch to batch.

This task can be realized either through the purchase of new costly vacuum deposition equipment or through retrofitting/upgrdaing of the existing coaters. The later approach allows for substantially lower investments in a much shorter time - without noticable trade-off for quality.

EssentOptics presents results of work performed by one of our customers to obtain complex band-pass and cut-off filters using a typical 700mm e-beam coater upgraded with IRIS 1017 spectral optical monitoring system from EssentOptics.

Visit "Optical Monitoring Systems" page to learn more about IRIS products and download the Application Notes.