PHOTON RT 7512 LWIR Spectrophotometer
PHOTON RT 7512 LWIR Spectrophotometers
Application
LWIR Transmission and Refection Measurement of Plano Optics at Normal and Variable Angles of Incidence
Description
Accurate and reliable infrared spectral measurements of optical coatings are one of the most critical challenges today. Optical manufacturers around the world specify increasingly sophisticated IR coatings for their planar optics focusing on better detection and identificaion of objects at long distances. Often, the production capabilities for obtaining optical coatings are well ahead of the existing metrological capabilities for certifying their quality.
The PHOTON RT 7512 spectrophotometer is a unique instrument specially designed to effectively meet these challenges. The instrument allows measuring the transmission and reflection of coatings designed for LWIR. An unsurpassed feature of the PHOTON RT 7512 is the ability to carry out automatic measurements at variable angles of incidence up to 60 degrees in polarized light. These non-trivial tests are supported with the built-in feature which accurately compensates for beam displacement at high angles and ensures S-pol and P-pol results in just a few minutes. Maximum thickness of the sample can be a record 40 mm.
KEY ADVANTAGES:
- Dispersive spectrophotometer
- High accuracy measurements at norrmal and variable AOI
- Built-in high-contrast poalrizers
- Extremely low noise measuremets
- Fully automatic operation
- Effective signal-to-noise ratio management
|
PARAMETER |
DESCRIPTION |
|---|---|
| MODEL | 7512 |
| OPTICAL CONFIGURATION | |
| Photometric functions | %T, %R |
| Effective wavelength range, µm | 7,5 - 14,0 |
| Built-in polarizers, µm | 7,5 - 14,0 |
| Optical scheme of monochromator | Czerny-Turner |
| Optics | Mirror: Au, Lenses: ZnSe + AR |
| Measurement of Transmission | Variable angle measurements: 0 - 60 deg angles of incidence |
| Measurement of Reflection |
Interchangeable sample stages with fixed angles of incidence: 10, 30, 45 and 60 deg Reference sample: gold mirror |
| Turning pitch angle of sample stage, deg | 0,01 |
| Beam displacement compensation, mm | 40 |
| Unattended polarization measurements with buil-in polarizers | S, P, (S + P) / 2 |
| Wavelength sampling pitch, nm | 5 - 100 |
| Spot size on measured sample (non-polarized light), mm | 2,0 x 6,0 (W x H) |
| Ultimate spectral resolution (non-polarized light), nm | 15 |
| Wavelength accuracy, nm | + / - 4,0 |
| Wavelength repeat accuracy, nm | + / - 2,0 |
| Photometric accuracy (47% T, λ0 = 10,6 µm, AOI = 40) | + / - 0,2% |
| Photometric repeat accuracy | + / - 0,1% |
| Stability of baseline (7,8 µm - 13,0 µm), % / hour* | + / - 0,3% |
| Stray light level ( (7,5 µm - 12,0 µm), % | < 0,2 |
| Light sources |
IR lamp HgAr wavelenth calibration verification lamp |
|
SAMPLE COMPARTMENT |
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|
Maximum sample size, mm |
150 x 200 |
| Maximum sample thickness, mm | 40 |
| Planar sample stage | For measurement of transmission and reflection of planar samples with size bigger than 8.0mm x 12mm |
| Synchronized positioning | Synchronized computer controlled positioning for sample stage and photodetectors unit (transmission) |
|
INTERFACE, DIMENSIONS AND WEIGHT |
|
|
Interface |
USB 2.0 |
|
Power consumption, Watt |
110 |
|
Power input |
110 - 220 VAC, 50 - 60 Hz |
|
Width x Depth x Height, mm |
760 x 380 x 350 (30" x 15.0" x 13 3/5") |
|
Net weight, kg (lbs) |
51 (112) |
|
* 60 minutes warm-up time |
|
The PHOTON RT 7512 spectrophotometer offers a unique range of measurement capabilities designed to meet the most challenging needs of optical coaters in the long-wave infrared spectrum. Built-in polarizers ensure meaningful results for transmission and reflection tests of samples at variable angles of incidence. Our signature capability to offset the detector and capture the displaced transmitted beam for angular-dependent tests provides unparalleled measurement accuracy and simulates field-like operating conditions for your coated samples.
Below are measurement examples demonstrating the exceptional performance of the PHOTON RT 7512 spectrophotometer.
The PHOTON RT 7512 spectrophotometer features the latest generation of low-noise, cryocooled MCT detectors. Combined with a meticulously designed instrument frame and effective management of background radiation, this results in exceptional long-term baseline stability.
The 2-hour baseline stability test shown below was performed with a single, full-range baseline calibration. The PHOTON RT 7512 spectrophotometer demonstrates outstanding performance, with less than 0.2% signal deviation over 60 consecutive scans.
The PHOTON RT 7512 spectrophotometer offers reflection measurements at different angles of incidence (10, 30, 34, and 60 degrees). Measurements at variable angles of incidence are performed with S-pol and P-pol baselines, followed by the instant calculation of the average reflection values. High repeatability and reproducibility of measurements are critical for processing multiple substrates and ensuring meaningful results under the most challenging conditions.
The repeatability and reproducibility test results are shown below for reflection measurement of a gold mirror at a 45-degree angle of incidence. The results demonstrate record-low signal deviation over 10 consecutive scans for both tests.
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