High accuracy IRIS and AKRA optical monitoring systems are designed to maximize the quality of the deposited optical coatings. Our products allow each vacuum coating process to be controlled accurately and reliably. Various system configurations cover wide wavelength range from 190 nm in UV up to 5000 nm in IR, offering tailored solutions to the broad spectrum of monitoring needs. Application of the systems allows our сustomers to cut costs, reduce or even eliminate coating defects and increase the process yield.
Please make your further selection below to learn more about IRIS and AKRA optical monitoring systems.
IRIS Broadband Optical Monitoring Systems
The IRIS Broadband Optical Monitoring Systems (BOM) represent the most advanced solution for monitoring of vacuum deposition processes. IRIS systems are designed to control transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coatings. The system is based on EOS low noise and precision spectrometers designed by EssentOptics. The system comes with a robust software package for measuring optical performance and visualization of measurement process on the system’s display.
AKRA Monochromatic Optical Monitoring Systems
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process in the record-wide wavelength range from 190 nm in UV up to 5000 nm in IR. The system is based on the originally-designed monochromator and control software for visualization of the measurement process on the system’s control display.