PHOTON RT UV-VIS-MWIR Spectrophotometers
The PHOTON RT UV-VIS-MWIR scanning spectrophotometer is a universal instrument designed specifically for unattended measurement of planar optical parts with coatings in the 185-5200 nm wavelength range. Measurement of absolute reflectance and transmittance at 0-75 deg AOI and variable polarization is performed without any additional attachments.
LINZA 150 Lens Measurement Spectrophotometers
LINZA 150 is the world only spectrophotometer designed for unattended measurement of transmittance and reflectance on lenses and lens assemblies.
IRIS Broadband Optical Monitoring Systems
The IRIS Broadband Optical Monitoring Systems (BOM) represent the most advanced solution for monitoring of vacuum deposition processes. IRIS systems are designed to control transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coatings. The system is based on EOS low noise and precision spectrometers designed by EssentOptics. The system comes with a robust software package for measuring optical performance and visualization of measurement process on the system’s display.
AKRA Monochromatic Optical Monitoring Systems
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process in the record-wide wavelength range from 190 nm in UV up to 5000 nm in IR. The system is based on the originally-designed monochromator and control software for visualization of the measurement process on the system’s control display.
The Multispectrum software
The MultiSpectrum software is designed for calculation of the final coatings and intermediate layers of the thin film stack. The calcuation results are used for reliable mapping of the deposition process and helping make informed decisions on process interruption or making corrections during the coating run.