EssentOptics will showcase the world’s first PHOTON RT scanning spectrophotometer designed for optical measurement applications with record-setting 190-4900 nm wavelength range at coming Optatec Exhibition in Frankfurt, Germany, May 20-22, 2014.
EssentOptics participated in the InterOpto 2013 exhibition during October 16-18, 2013, the leading showcase platform for lasers and optics in Japan.
EssentOptics demonstrates the world's first universal scanning spectrophotometer with a 190-4500 nm range and unattended transmittance / absolute reflectance measurement at «Laser 2013 World of Photonics» (13-16 May 2013, Munich, Germany).
EssentOptics will demonstrate its latest product developments at Photonics 2013 in Moscow (March 25-27, 2013)
SOLAR LS chose PHOTON RT Scanning Spectrophotometer for its optical measurement needs
KBTEM-OMO Optical Research Enterprise has been actively using our PHOTON RT scanning spectrophotometer to measure optics almost for one year. Their recent review on product features and obtained results is added to the site.
EssentOptics is expanding its international presence through a new distribution agreements with Indeco, Inc (Japan), and VM-TIM (Germany)
Photon RT spectrophotometer from EssentOptics wins Laser Association 2012 Award
Photon RT spectrophotometer from EssentOptics is awarded "The Best Innovative Product" medal.
EssentOptics will take part in the 7th International Forum on Optical Devices and Technologies "OPTICS-EXPO 2011" to be held during October 25-28 in All Russia Exhibition Center in Moscow.
PHOTON RT Spectrophotometers
World's first UV-VIS-MWIR spectrophotometer designed for optical coaters
Linza 150 Spectrophotometers
The world's only spectrophotometer developed to test lenses and lens assemblies
AKRA Monochromatic Optical Monitoring System
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process.
IRIS Broadband Optical Monitoring Systems
IRIS systems are designed to control the transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coating. Designed for integration virtually into any vacuum chamber