EssentOptics demonstrates the world's first universal scanning spectrophotometer with a 190-4500 nm range and unattended transmittance / absolute reflectance measurement at «Laser 2013 World of Photonics» (13-16 May 2013, Munich, Germany).
Challanging optical projects do require unique spectral instruments. EssentOptics, a specialized manufacturer of optical instruments, introduces a unique configuration of its PHOTON RT universal scanning spectrophotometer focusing on for the most demanding thin film applications. Each of the newly added features - from the widest 190-4500 nm range to unattended variable angle measurement up to 75 degrees, from 220-4500 nm spectral range polarization measurement to unattended nkd determination - became possible through an intensive cooperation with our customers. The new product capabilities become available today - for the measurement needs of tomorrow.
We invite you to visit our booth #C1.226 / B shared jointly with VM-TIM, our European distributor, at the one of the world's leading Laser 2013 World of Photonics Exhibition and get familir with the most advanced developments of our company.
PHOTON RT Spectrophotometers
World's first UV-VIS-MWIR spectrophotometer designed for optical coaters
Linza 150 Spectrophotometers
The world's only spectrophotometer developed to test lenses and lens assemblies
AKRA Monochromatic Optical Monitoring System
The AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process.
IRIS Broadband Optical Monitoring Systems
IRIS systems are designed to control the transmission or reflection spectra, and allow for layer-by-layer correction of the thin film coating. Designed for integration virtually into any vacuum chamber